Clyde Lettsome covers standard and more advanced capabilities of a function generator using the SIGLENT SDG1032X as an example:
In this video, Thomas Rottach from SIGLENT EU presents information on overcoming common power supply design issues through different testing methods. The first presentation of this material was at the Power Electronics Forum @ virtual Electronica 2020.
In this video, we use the Search and Navigate feature of the SIGLENT SDS2X Plus scope to isolate and indicate low voltage conditions of an input signal. Here, we use an SDG signal generator to produce a 60 Hz sine wave and we introduce a few periods of much lower voltage.. simulating dirty power/brownout conditions … Continued
In this video, we show how to use the automated Bode Plot feature of the SIGLENT SDS1004X-E series of four-channel oscilloscopes to create a frequency response curve. This video applies to the SIGLENT SDS1104X-E, SDS1204X-E, SDS2000X-E, SDS2000X Plus, and SDS5000X oscilloscopes as well as the SDG X series (SDG1X, 2X, and 6X) of arbitrary waveform … Continued
In this video, Chris shows how terminations affect signals and compares various 50 ohm terminations using a SIGLENT scope and function generator:
The SIGLENT SDG series of arbitrary waveform generators are ideal for sourcing standard and custom waveforms. This video describes the common features available across the entire SDG line as well as some of the specific features that can be useful in tricky applications.
Siglent Founder and CEO Eric Qin visited the EEVblog Lab and very kindly agreed to sit down for a quick impromptu chat. NOTE: Proper English subtitles are available. http://siglent.com/ens/ Forum: http://www.eevblog.com/forum/blog/eev… EEVblog Main Web Site: http://www.eevblog.com The 2nd EEVblog Channel: http://www.youtube.com/EEVblog2
Learn how to easily capture and transfer waveform data from a SIGLENT SDG osiclloscope to an SDG function generator. Once the data has been transferred to the SDG, you can edit and adjust the waveform and perform extended testing.