SDS5000X HD Series Digital Storage Oscilloscope

  • 350 MHz, 500 MHz, 1 GHz models
  • 4/6/8 analog channels + 1 external trigger
  • 16 digital channels
  • Sampling rate up to 5 GSa/s
  • Up to 2.5 Gpts waveform length
  • Waveform capture rate up to 650,000 wfm/s (Sequence mode)
  • Typical ENOB at 1 GHz of 8.2 bits

Product Overview

Supports 8 channels with 12-bit resolution, ultra-low noise, and precision measurements for multi-channel applications. SDS5000X HD are available in 4, 6 and 8 channels, bandwidths of 350 MHz, 500 MHz and 1 GHz, 5 GSa/s sampling rate, maximum record length of 2.5 Gpts/ch. Siglent SPO technology enables 650,000 wfm/s capture rate with 256-level intensity grading. Digital trigger features high sensitivity, low jitter, and supports smart triggers, serial decoding. Tools such as History waveform recording, Search and Navigate functions, Mask Test, Bode Plot, Power Analysis allow for extended waveform records to be captured, stored, and analyzed. An impressive array of measurement and math capabilities, as well as serial decoding are also features of them. The SDS5000X HD employs a 12.1‘ capacitive touch screen and supports multi-touch gestures, with the addition of user-friendly UI design, can greatly improve the operational efficiency.

BandwidthChannelsReal time
sampling rate
Capture rateMemory depthPrice
SDS5034X HD350 MHz4 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 7,760Buy Now
SDS5054X HD500 MHz4 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 9,300Buy Now
SDS5104X HD1 GHz4 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 12,180Buy Now
SDS5036X HD350 MHz6 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 8,530Buy Now
SDS5056X HD500 MHz6 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 10,830Buy Now
SDS5106X HD1 GHz6 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 14,380Buy Now
SDS5038X HD350 MHz8 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 9,580Buy Now
SDS5058X HD500 MHz8 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 12,460Buy Now
SDS5108X HD1 GHz8 + EXT5 GSa/s650,000 wfm/s2.5 Gpts€ 16,020Buy Now

Key Features

  • 8/6/4 analog channels for SDS5000X HD
  • Up to 1 GHz bandwidth with up to 5 GSa/s sample rate
  • 12-bit ADC
  • Low noise floor: 140 μVrms @ 1 GHz bandwidth (typical)
  • SPO technology
    Waveform capture rates up to 160,000 wfm/s in normal mode and 650,000 wfm/s in sequence mode
    Supports 256-level intensity grading and color temperature display modes
    Up to 2.5 Gpts/ch waveform length
    Digital trigger system
  • Intelligent trigger: Edge, Slope, Pulse, Window, Runt, Interval, Dropout, Pattern, Qualified, Nth edge, Setup/hold, Delay and Video (HDTV supported). Zone Trigger simplifies advanced triggering
  • Serial bus triggering and decoder, supports protocols including I2C, SPI, UART, CAN, LIN, CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester and ARINC429
  • Segmented acquisition (Sequence) mode, dividing the maximum record length into multiple segments (up to 170,000), according to trigger conditions set by the user, with a very small dead time between segments to capture the qualifying event
  • History waveform record (History) function, the maximum recorded waveform length is 170,000 frames
  • Automatic measurements on 60+ parameters, supports statistics with histogram, track, trend, gating measurement, and measurements on Math, History and Memory traces
  • 8 Math traces (8 Mpts FFT, Filter, addition, subtraction, multiplication, division, integration, differential, square root, etc.), supports formula editor
  • Abundant data analysis functions such as Search, Navigate, Digital Voltmeter, Counter, Waveform Histogram, Bode plot, Power Analysis and Double Pulse Test
  • High Speed hardware-based Average, Hi-Res; High Speed hardware-based Mask Test function, with Mask Editor tool for creating user-defined masks
  • 16 digital channels
  • External 50 MHz waveform generator supported
  • Large 12.1” TFT-LCD display with 1280 * 800 resolution; Capacitive touch screen supports multi-touch gestures
  • Interfaces include: 2x USB Host 3.0, USB 2.0 Host, USB 3.0 Device (USBTMC), 1000M LAN, HDMI, External Triger In, Aux Out (Pass/Fail, Trigger Out), 10 MHz In, 10 MHz Out
  • Built-in web server supports remote control over the LAN port using a web browser. Support SCPI remote control commands. Support external mouse and keyboard

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Product Characteristics

Power-Up Sequence Analysis View more

Power-Up Sequence Analysis

Modern electronic systems incorporate various chips and modules whose initialization and operation may interfere with each other. Power-up sequence testing ensures that signals from different circuit modules follow the correct timing to avoid conflicts and guarantee system stability. For example, improper power-up sequences in communication systems can lead to data transmission errors. As circuit complexity increases, so do the challenges of power-up testing. The SDS5000X HD captures the entire power-up process of all relevant signals in a single acquisition, reducing measurement time, improving efficiency, and minimizing errors caused by repeated tests. For complex circuits with 8 power rails, this capability enables one-shot measurements.

Three-Phase Power Analysis View more

Three-Phase Power Analysis

Using an 8-channel oscilloscope for three-phase power analysis allows simultaneous connection to all phases. It synchronously measures three-phase voltage and current signals, accurately capturing waveforms and parameters in real time. Users can directly observe and compare phase relationships to ensure balance. With the Fast Fourier Transform (FFT) function, multi-channel oscilloscopes perform harmonic analysis on three-phase signals. Optional three-phase analysis software supports vector diagram testing for motors, power quality assessment, ripple analysis, and efficiency evaluation.

Complete Wide Bandgap Semiconductor Testing Solution View more

Complete Wide Bandgap Semiconductor Testing Solution

The launch of Siglent latest 8-channel oscilloscopes and optically isolated probes completes the final piece of the wide bandgap semiconductor testing puzzle. The SDS5000X HD achieves a rise time at the picosecond (ps) level, capturing fast-switching waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices. It analyzes transient voltage and current changes during switching, as well as characteristics like overshoot and ringing, to optimize circuit design and signal integrity.


Optional Accessories

Support and Resources