Technical Videos

Spectrum Analyzers

How to observe demodulated audio from a spectrum analyzer

December 16, 2020

Viewing demodulated audio can be important when troubleshooting a transmitter.   In this video, I demodulate an FM radio station using a SIGLENT spectrum analyzer and view the output signal on an oscilloscope.

Distance-to-Fault cable testing with the SVA1000X

March 3, 2020

In this video, we use the Distance-to-Fault (DTF) function available on the SIGLENT SVA1000X Spectrum and Vector Network Analyzer instruments to test a few sections of coaxial cabling. DTF uses frequency domain reflectometry (FDR) to highlight impedance differences along a length of cable. This can be used to determine the distance to adapters, faults, and … Continued

Quick remote computer control using LXI Tools

October 14, 2019

  In this video, we introduce you to LXI Tools, an open-source instrument programming and control application that has a small footprint and excellent performance. It works seamlessly with a variety of SIGLENT  products, including SDSX and XE scopes, SDGX generators, and SDM DMMs. Special thanks to Martin Lund and the other developers of LXI … Continued

Ken Wyatt EMI Tests: Near-field probing

October 11, 2019

In this video, EMI Guru Ken Wyatt (@EMI_Guru) shows how to use Near-Field probes and a spectrum analyzer to troubleshoot component/board level EMI issues.

Attenuator verification using a spectrum analyzer and tracking generator

October 11, 2019

In this video, we show how to quickly and easily check the attenuation value of an attenuator using the tracking generator on a SIGLENT SVA1015X spectrum and vector network analyzer. This technique also applies to the SSA3000X series of products.   There is also an application note here: Attenuator Verification  

VSWR measurement with a SIGLENT SVA1015X

October 11, 2019

In this video, we use a SIGLENT SVA1015X spectrum and vector network analyzer with optional VNA function to measure the VSWR curves for the input and output of an RF Amplifier. This technique is helpful for functional verification of known devices as well as characterization of unknown devices.